EPR Studies of defects in silicon-Reference-Cited by-同舟云学术

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EPR Studies of defects in silicon

Published:1981 Issue:2 Volume:16 Page:209-215
ISSN:0023-4753
Container-title:Kristall und Technik
language:de
Short-container-title:Krist. Techn.

Author:

Weber E.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry,Pharmacology (medical),Complementary and alternative medicine,Pharmaceutical Science

Reference18 articles.

1. : at this symposium

2. : Diploma thesis, Köln 1979, unpublished

3. Properties of Silicon Doped with Iron or Copper

4. , , , , , , , , , , : Proc. Int. Conf. on Radiation Physics of Semiconductors and Related Materials, Tbilisi, USSR, 1979, in press

5. Photo-EPR of Dislocations in silicon

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Formation energies of silicon self-interstitials using periodic coupled cluster theory;Physical Review B;2023-09-12

2. Structural damage in thin SLIM-Cut c-Si foils fabricated for solar cell purposes: atomic assessment by electron spin resonance;Semiconductor Science and Technology;2015-10-12

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