On the Location of Boron in SiO 2 ‐Embedded Si Nanocrystals—An X‐ray Absorption Spectroscopy and Density Functional Theory Study-Reference-Cited by-同舟云学术

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On the Location of Boron in SiO 2 ‐Embedded Si Nanocrystals—An X‐ray Absorption Spectroscopy and Density Functional Theory Study

Published:2021-05-04 Issue:7 Volume:258 Page:2000623
ISSN:0370-1972
Container-title:physica status solidi (b)
language:en
Short-container-title:Phys. Status Solidi B

Author:

Hiller Daniel¹²^ORCID,König Dirk³⁴,Nagel Peter⁵,Merz Michael⁵,Schuppler Stefan⁵,Smith Sean C.³⁶

Affiliation:

1. Chair of Nanoelectronics Institute of Semiconductors and Microsystems (IHM) Technische Universität Dresden 01187 Dresden Germany

2. Research School of Engineering Australian National University (ANU) Canberra ACT 2601 Australia

3. Integrated Materials Design Lab (IMDL) Australian National University (ANU) Canberra ACT 2601 Australia

4. Integrated Materials Design Centre (IMDC) University of New South Wales (UNSW) Sydney NSW 2052 Australia

5. Institute for Quantum Materials and Technologies (IQMT) Karlsruhe Institute of Technology (KIT) 76021 Karlsruhe Germany

6. Department of Applied Mathematics Research School of Physics Australian National University (ANU) Canberra ACT 2601 Australia

Funder

Alexander von Humboldt-Stiftung

Deutsche Forschungsgemeinschaft

RWTH Aachen University

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssb.202000623

Reference51 articles.

1. Photoluminescence from B-doped Si nanocrystals

2. Quantitative evaluation of boron-induced disorder in multilayers containing silicon nanocrystals in an oxide matrix designed for photovoltaic applications

3. Boron-Incorporating Silicon Nanocrystals Embedded in SiO2: Absence of Free Carriers vs. B-Induced Defects

4. Absence of free carriers in silicon nanocrystals grown from phosphorus- and boron-doped silicon-rich oxide and oxynitride

5. Critical Size for Carrier Delocalization in Doped Silicon Nanocrystals: A Study by Ultrafast Spectroscopy

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1. Understanding silicon monoxide gas evolution from mixed silicon and silica powders;Nanoscale Horizons;2023

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