Optical and Mechanical Properties of Thin PTFE Films, Deposited from a Gas Phase-Reference-Cited by-同舟云学术

Optical and Mechanical Properties of Thin PTFE Films, Deposited from a Gas Phase

Published:2023-02-19 Issue:6 Volume:308 Page:
ISSN:1438-7492
Container-title:Macromolecular Materials and Engineering
language:en
Short-container-title:Macro Materials & Eng

Author:

Grytsenko Kostyantyn¹²,Kolomzarov Yurii²,Lytvyn Peter²,Kondratenko Olga²,Sopinskyy Mykola²,Lebedyeva Iryna³,Niemczyk Agata⁴,Baranovska Jolanta⁴,Moszyński Dariusz⁵,Villringer Claus¹,Schrader Sigurd¹^ORCID

Affiliation:

1. Department of Photonic Laser and Plasma Technologies Institute of Applied Physics Technical University of Applied Sciences Wildau Hochschulring 1 D‐15745 Wildau Germany

2. Department of Optoelectronics Institute of Semiconductor Physics pr. Nauky 41 Kyiv 03650 Ukraine

3. Faculty of Mechanics and Mathematics Taras Shevchenko University of Kyiv 64/13 Volodymyrs'ka Str. Kyiv 01601 Ukraine

4. Department of Materials Technology Faculty of Mechanical Engineering and Mechatronics West Pomeranian University of Technology in Szczecin Szczecin 70‐310 Poland

5. Department of Chemical and Environment Engineering Faculty of Chemical Technology and Engineering West Pomeranian University of Technology in Szczecin Szczecin 71‐065 Poland

Abstract

AbstractThin polytetrafluoroethylene (PTFE) films are produced by deposition from a gas phase by two methods: electron‐enhanced vacuum deposition (EVD) and EVD + low‐temperature plasma (LTP). Structure, morphology, and composition of the films are studied by IR spectroscopy, atomic force microscopy, and X‐ray photoelectron spectroscopy. They are close to the structure of bulk PTFE. The roughness of the films’ surface is changed with gas pressure and LTP power variations. Films are transparent from UV to near‐infrared regions. Refractive and extinction indices and their anisotropy are measured by spectral ellipsometry. They are tuned by variations of deposition conditions. Hardness and Young modulus of the films are increased if EVD + low power LTP is used for film deposition. Use of EVD + LTP also increases thermal stability of the films. Contact angle of the films corresponds to the bulk PTFE. The PTFE molecules oriented are preferentially in perpendicular direction to the substrate surface.

Publisher

Wiley

Subject

Materials Chemistry,Polymers and Plastics,Organic Chemistry,General Chemical Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/mame.202200617

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