Genome‐based prediction of multiple wheat quality traits in multiple years-Reference-Cited by-同舟云学术

Genome‐based prediction of multiple wheat quality traits in multiple years

Published:2020-07-25 Issue:3 Volume:13 Page:
ISSN:1940-3372
Container-title:The Plant Genome
language:en
Short-container-title:Plant Genome

Author:

Ibba Maria Itria¹^ORCID,Crossa Jose¹²^ORCID,Montesinos‐López Osval A.³,Montesinos‐López Abelardo⁴,Juliana Philomin¹,Guzman Carlos⁵,Delorean Emily⁶,Dreisigacker Susanne¹,Poland Jesse⁶^ORCID

Affiliation:

1. International Maize and Wheat Improvement Center (CIMMYT) Km 45 Carretera Mexico‐Veracruz CP 52640 Mexico

2. Colegio de Postgraduados (COLPOS), Montecillos Edo. de México CP 56230 México

3. Facultad de Telemática Universidad de Colima Colima México

4. Departamento de Matemáticas Centro Universitario de Ciencias Exactas e Ingenierías (CUCEI), Universidad de Guadalajara Guadalajara Jalisco 44430 México

5. Departamento de Genética Escuela Técnica Superior de Ingeniería Agronómica y de Montes, Campus de Rabanales, Universidad de Córdoba Córdoba Spain

6. Department of Agronomy Kansas State University, 2004 Throckmorton Plant Science Center Manhattan KS 66506 USA

Funder

Foundation for Research Levy on Agricultural Products

Agricultural Agreement Research Fund (JA) in Norway through NFR

Publisher

Wiley

Subject

Plant Science,Agronomy and Crop Science,Genetics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/tpg2.20034

Reference34 articles.