Review on TEM analysis of growth twins in nanocrystalline palladium thin films: Toward better understanding of twin-related mechanisms in high stacking fault energy metals-Reference-Cited by-同舟云学术

Review on TEM analysis of growth twins in nanocrystalline palladium thin films: Toward better understanding of twin-related mechanisms in high stacking fault energy metals

Published:2014-02-14 Issue:6 Volume:251 Page:1111-1124
ISSN:0370-1972
Container-title:physica status solidi (b)
language:en
Short-container-title:Phys. Status Solidi B

Author:

Idrissi Hosni¹²,Amin-Ahmadi Behnam¹,Wang Binjie¹,Schryvers Dominique¹

Affiliation:

1. Electron Microscopy for Materials Science (EMAT); Department of Physics; University of Antwerp; Groenenborgerlaan 171 2020 Antwerp Belgium

2. Institute of Mechanics; Materials and Civil Engineering; Université Catholique de Louvain; Place Sainte Barbe 2 1348 Louvain-la-Neuve Belgium

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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5. Stretchable gold conductors on elastomeric substrates

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