Scanning thermal microscopy: A nanoprobe technique for studying the thermal properties of nanocomponents-Reference-Cited by-同舟云学术

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Scanning thermal microscopy: A nanoprobe technique for studying the thermal properties of nanocomponents

Published:2011-01-10 Issue:2 Volume:248 Page:370-374
ISSN:0370-1972
Container-title:physica status solidi (b)
language:en
Short-container-title:phys. stat. sol. (b)

Author:

Wielgoszewski Grzegorz,Sulecki Przemysław,Gotszalk Teodor,Janus Paweł,Grabiec Piotr,Hecker Michael,Ritz Yvonne,Zschech Ehrenfried

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssb.201046614/fullpdf

Reference20 articles.

1. Materials for Information Technology

2. http://www.itrs.net/

3. Novel SThM nanoprobe for thermal properties investigation of micro- and nanoelectronic devices

4. Novel high resolution scanning thermal probe

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2. A Comprehensive Review for Micro/Nanoscale Thermal Mapping Technology Based on Scanning Thermal Microscopy;Journal of Thermal Science;2022-07

3. A Review on Principles and Applications of Scanning Thermal Microscopy (SThM);Advanced Functional Materials;2019-09-02

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