Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection-Reference-Cited by-同舟云学术

Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection

Published:2012-05-15 Issue:1 Volume:45 Page:46-49
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Mouhib T.¹²,Delcorte A.¹,Poleunis C.¹,Bertrand P.¹

Affiliation:

1. Institute of Condensed Matter and Nanosciences - Bio and Soft Matter (IMCN/BSMA); Université catholique de Louvain; Croix du Sud 1, Boltzmann bte L7.04.01 B-1348 Louvain-la-Neuve Belgium

2. Ecole Supérieure de Technologie; Université Hassan 1; Passage d'Alger, B.P. : 218 26100 Berrechid Morocco

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.5043/fullpdf

Reference17 articles.

1. Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry

2. Information on the Monomer Sequence of Poly(lactic acid) and Random Copolymers of Lactic Acid and Glycolic Acid by Examination of Static Secondary Ion Mass Spectrometry Ion Intensities

3. Controlled Density Patterning of Tolylterpyridine-Tagged Oligonucleotides

4. Time-of-flight secondary ion mass spectrometry: techniques and applications for the characterization of biomaterial surfaces

5. Matrix-Enhanced Secondary Ion Mass Spectrometry: A Method for Molecular Analysis of Solid Surfaces

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