Corrugated Heterojunction Metal-Oxide Thin-Film Transistors with High Electron Mobility via Vertical Interface Manipulation-Reference-Cited by-同舟云学术

Corrugated Heterojunction Metal-Oxide Thin-Film Transistors with High Electron Mobility via Vertical Interface Manipulation

Author:

Lee Minuk¹,Jo Jeong-Wan¹,Kim Yoon-Jeong¹,Choi Seungbeom²,Kwon Sung Min¹,Jeon Seong Pil¹,Facchetti Antonio³⁴,Kim Yong-Hoon²⁵,Park Sung Kyu¹^ORCID

Affiliation:

1. School of Electrical and Electronic Engineering; Chung-Ang University; Seoul 06974 Korea

2. SKKU Advanced Institute of Nanotechnology (SAINT); Sungkyunkwan University; Suwon 16419 Korea

3. Department of Chemistry and the Materials Research Center; Northwestern University; 2145 Sheridan Road Evanston IL 60208 USA

4. Flexterra Corporation; 8025 Lamon Avenue Skokie IL 60077 USA

5. School of Advanced Materials Science and Engineering; Sungkyunkwan University; Suwon 16419 Korea

Funder

National Research Foundation of Korea

Ministry of Science ICT and Future Planning

Korean Ministry of Science & Information and Communication Technology

Institute for Information and communications Technology Promotion

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

Reference60 articles.

Cited by 85 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献