In‐Plane Detection of Guided Surface Plasmons for High‐Speed Optoelectronic Integrated Circuits-Reference-Cited by-同舟云学术

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In‐Plane Detection of Guided Surface Plasmons for High‐Speed Optoelectronic Integrated Circuits

Published:2017-11-24 Issue:1 Volume:3 Page:1700196
ISSN:2365-709X
Container-title:Advanced Materials Technologies
language:en
Short-container-title:Adv. Mater. Technol.

Author:

Panchenko Evgeniy¹²^ORCID,Cadusch Jasper J.¹,Avayu Ori³,Ellenbogen Tal³,James Timothy D.¹,Gómez Daniel²⁴,Roberts Ann¹

Affiliation:

1. School of Physics University of Melbourne Victoria 3010 Australia

2. Melbourne Centre for Nanofabrication Australian National Fabrication Facility Clayton Victoria 3168 Australia

3. Department of Physical Electronics School of Electrical Engineering Tel Aviv University Tel Aviv 6997801 Israel

4. RMIT University Victoria 3000 Australia

Funder

Australian Research Council

Publisher

Wiley

Subject

Industrial and Manufacturing Engineering,Mechanics of Materials,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/admt.201700196

Reference41 articles.

1. Lithographic challenges and their solutions for critical layers in sub-14nm node logic devices

2. 12.5 nm base pseudomorphic heterojunction bipolar transistors achieving fT=710GHz and fMAX=340GHz

3. InAs Thin-Channel High-Electron-Mobility Transistors with Very High Current-Gain Cutoff Frequency for Emerging Submillimeter-Wave Applications

4. Speed limitations due to interconnect time constants in VLSI integrated circuits

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