Characterization of size-segregated aerosols using ToF-SIMS imaging and depth profiling-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Characterization of size-segregated aerosols using ToF-SIMS imaging and depth profiling

Published:2014-05-22 Issue:7 Volume:46 Page:480-488
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Cheng Wenjuan¹,Weng Lu-Tao²³,Li Yongjie¹,Lau Arthur¹,Chan Chak¹³,Chan Chi-Ming¹³

Affiliation:

1. Division of Environment; Hong Kong University of Science and Technology; Clear Water Bay Hong Kong

2. Materials Preparation and Characterization Facility; Hong Kong University of Science and Technology; Clear Water Bay Hong Kong

3. Department of Chemical and Biomolecular Engineering; Hong Kong University of Science and Technology; Clear Water Bay Hong Kong

Funder

HK Research Grants Council General Research Fund

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference35 articles.

1. Visibility: Science and Regulation

2. Atmospheric Aerosols: Composition, Transformation, Climate and Health Effects

3. Exposure Assessment for Atmospheric Ultrafine Particles (UFPs) and Implications in Epidemiologic Research

4. Investigation of fine atmospheric particle surfaces and lung lining fluid interactions using XPS

5. Linking exposure to environmental pollutants with biological effects

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigating the contribution of grown new particles to cloud condensation nuclei with largely varying preexisting particles – Part 1: Observational data analysis;Atmospheric Chemistry and Physics;2023-12-15

2. Analysis of black carbon in environmental and biological media: Recent progresses and challenges;TrAC Trends in Analytical Chemistry;2023-12

3. Inhibitor-Free Area-Selective Atomic Layer Deposition with Feature Size Down to Nearly 10 nm;Chemistry of Materials;2023-01-30

4. Surface chemistry of atmospheric nanoparticles during a haze episode in Beijing by TOF-SIMS;Gondwana Research;2022-10

5. Dimensional Stacking for Machine Learning in ToF‐SIMS Analysis of Heterostructures;Advanced Materials Interfaces;2020-12-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3