Automatic Test Pattern Generation for Robust Quantum Circuit Testing

Author:

Chen Kean1ORCID,Ying Mingsheng2ORCID

Affiliation:

1. Computer and Information Science, University of Pennsylvania, Philadelphia, United States

2. University of Technology Sydney, Sydney, Australia

Abstract

Quantum circuit testing is essential for detecting potential faults in realistic quantum devices, while the testing process itself also suffers from the inexactness and unreliability of quantum operations. This paper alleviates the issue by proposing a novel framework of automatic test pattern generation (ATPG) for robust testing of logical quantum circuits. We introduce the stabilizer projector decomposition (SPD) for representing the quantum test pattern, and construct the test application (i.e., state preparation and measurement) using Clifford-only circuits, which are rather robust and efficient as evidenced in the fault-tolerant quantum computation. However, it is generally hard to generate SPDs due to the exponentially growing number of the stabilizer projectors. To circumvent this difficulty, we develop an SPD generation algorithm, as well as several acceleration techniques which can exploit both locality and sparsity in generating SPDs. The effectiveness of our algorithms are validated by 1) theoretical guarantees under reasonable conditions, 2) experimental results on commonly used benchmark circuits, such as Quantum Fourier Transform (QFT), Quantum Volume (QV) and Bernstein-Vazirani (BV) in IBM Qiskit.

Publisher

Association for Computing Machinery (ACM)

Reference44 articles.

1. [n. d.]. Qiskit. https://qiskit.org.

2. Improved simulation of stabilizer circuits

3. Antonio Acin. 2001. Statistical distinguishability between unitary operations. Physical review letters 87, 17 (2001), 177901.

4. Unbiased simulation of near-Clifford quantum circuits

5. Detection and diagnosis of single faults in quantum circuits;Bera Debajyoti;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,2017

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