Author:
,Solis Cortazar J. C.,López Matus A. K., ,Rojas Blanco L., ,Pérez Hernández G., ,Zamudio Torres I., ,Pérez Escobar B. L., ,Castillo Palomera R., ,Ramírez Morales E.,
Abstract
TiO2 and ZnO films were synthesized by the dip-coating method. The coupling of thin films of metal sulfides: CuS and ZnS by thermal evaporation in each semiconductor oxide was analyzed. TiO2, CuS/TiO2, ZnS/TiO2, ZnO, CuS/ZnO, and ZnS/ZnO samples were analyzed by X-ray diffraction, Raman microscopy, atomic force microscopy, UV-Vis spectroscopy, and photoresponse. The optical and morphological analysis revealed that the CuS/TiO2 and CuS/ZnO samples present better properties than the pristine samples. This was attributed to the fact that their absorption edges move to lower energy regions and their roughness increases refraction, so there is a greater photoelectric response due to the accumulation of photo-injected electrons in the conduction band.
Publisher
Virtual Company of Physics
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献