Analysis of illumination coherence properties in small-source systems such as synchrotrons-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Analysis of illumination coherence properties in small-source systems such as synchrotrons

Published:2003-05-10 Issue:14 Volume:42 Page:2506
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Chang Chang,Naulleau Patrick,Attwood David

Publisher

The Optical Society

Reference11 articles.

1. Applications of wavefront division interferometers in soft x rays

2. Two‐dimensional coherence measurements with Fresnel mirrors

3. Relationship Between Spatial Coherence of Synchrotron Radiation and Emittance

4. Diffractive optical elements based on Fourier optical techniques: a new class of optics for extreme ultraviolet and soft x-ray wavelengths

5. Spatial coherence of synchrotron radiation

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Genuine-field modeling of partially coherent X-ray imaging systems;Journal of Synchrotron Radiation;2020-07-10

2. Impact of EUV absorber variations on wafer patterning;Extreme Ultraviolet (EUV) Lithography X;2019-03-26

3. Evaluation of partial coherence correction in X-ray ptychography;Optics Express;2015-02-23

4. Study and comparison of negative tone resists for fabrication of bright field masks for 14nm node;SPIE Proceedings;2012-11-08

5. EUV mask line edge roughness;SPIE Proceedings;2012-03-29

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP