Thickness measurement of bimetallic film using surface plasmon resonance holographic microscopy

Abstract

Bimetallic film with high stability and sensitivity is often used to excite surface plasmon resonance (SPR). The thicknesses of the bimetallic film play an important role in quantitative retrieval of the sample’s parameters, and a precise measurement method is not available until now. In this paper, we propose a method for measuring the thicknesses of bimetallic film using surface plasmon resonance holographic microscopy (SPRHM). Considering that the refractive index of the dielectric upon the bimetallic film sensitively modulates the SPR phase response, the two thickness parameters of bimetallic film can be calculated by two phase-contrast SPR images with two different liquid dielectrics. The capability of this method was verified with several Ag-Au film couples by using a compact SPRHM setup. Our work provides a precise characterization method for the parameters of SPR configuration and may find wide applications in the research fields of SPR sensing and imaging.