Observation of fundamental charge noise in electro-optic photonic integrated circuits

Abstract

We observed a novel 1/f-type frequency noise in Lithium Niobate and Lithium Tantalate microresonators, distinct from thermorefractive noise and originating from thermodynamic charge fluctuations. Our results establish electrical Johnson-Nyquist noise as the fundamental refractive noise limit for Pockels integrated photonics.