Reliability challenges in the nanoelectronics era-Reference-Cited by-同舟云学术

Reliability challenges in the nanoelectronics era

Published:2006-09 Issue:9-11 Volume:46 Page:1403-1414
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

van Roosmalen A.J.,Zhang G.Q.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Van Roosmalen AJ. Strategic Research Agenda of Nanoelectronics, Eniac, first edition, 2005.

2. Baldi L. Priority summary of Eniac SRA, June, 2006.

3. Zhang GQ, Van Roosmalen AJ, Graef M. The rationale and paradigm of More than Moore, proceedings of 56th ECTC, ISSN 0569-5503, USA, 2006;151–156.

4. International Technology Roadmap of Semiconductors (ITRS), 2005.

5. Zhang GQ, Van Driel W and Fan XJ. Mechanics of microelectronics, Series: Solid Mechanics and Its Applications, vol. 141, ISBN: 1-4020-4934-X, Springer, 2006.

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