Bond reliability under humid environment for coated copper wire and bare copper wire

Author:

Uno Tomohiro

Publisher

Elsevier BV

Reference17 articles.

1. Singh I, On JY, Levine L. Enhancing fine pitch, high I/O devices with copper ball bonding. In: Proc 55th electronic components and technology conf; 2005. p. 843–7.

2. Kam J, Meng H, Stephan D, Calipito D, Dittmer K, Jamin L, et al. Materials characteristics of soft copper wires designed for advance application. In: Proc SEMICON Singapore; 2007. p. 49–54.

3. Saraswati, Tehint E, Stephan D, Goh H, Pasamanero E, Calpito D, et al. High temperature storage (HTS) performance of copper ball bonding wires. In: Electronic packaging technology conf, Singapore; 2005. p. 602–7.

4. Hang C, Wang C, Shi M, Wu S, Wang H. Study of copper free air ball in thermosonic copper ball bonding. In: 6th International conf on electronic packaging technology; 2005. p. 414–8.

5. Ho H, Tan J, Tan Y, Toh B, Xavier P. Modeling energy transfer to copper wire for bonding in an inert environment. In: Proc 7th electronics packaging technology conf EPTC; 2005. p. 292–7.

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