Reliability assessment and failure mode analysis of MEMS accelerometers for space applications-Reference-Cited by-同舟云学术

Reliability assessment and failure mode analysis of MEMS accelerometers for space applications

Published:2018-09 Issue: Volume:88-90 Page:846-854
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Marozau I.,Auchlin M.,Pejchal V.,Souchon F.,Vogel D.,Lahti M.,Saillen N.,Sereda O.

Funder

European Space Agency

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Reliability of MEMS for space applications;Shea,2006

2. Introduction: reliability of MEMS;Hartzell,2011

3. MEMS for pico-to micro-satellites;Shea,2009

4. Failure modes and mechanisms;Stark,1999

5. Qualification testing protocol for MEMS;Stark,1999

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