Author:
Barnes A.,Heliere F.,Villar P.,Stuhldreier H.,Beaurain C.,Bouw D.,Grunwald M.,Moess E.,Muck T.,Schildbach C.,Ayles T.,Kramer A.,Bildner B.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Report for Mission Selection: Biomass, ESA SP-1324/1;ESA,2012
2. GaN Reliability Enhancement and Technology Transfer Initiative (GREAT2);Hirche,2014
3. Channel temperature determination in high-power AlGaN/GaN HFETs using electrical methods and Raman spectroscopy;Simms;IEEE Trans. Electron Devices,2008
4. Test Method Standards For Microcircuits – Mil-Std-883.
5. ECSS Q-ST-60-12C (Rev 2), Space product assurance, Electrical, electronic and electromechanical (EEE) components.
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