Obtaining thermal resistance of mold compounds using a package structure model with a heat-generating test element group: Comparison of the thermal conductivity and glass transition temperature of epoxy mold compounds

Author:

Ishikawa Yuki,Takao Tomoya,Saito Takeyasu

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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1. Ultra High Voltage Semiconductor Power Devices for Grid Applications;Rahimo,2010

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4. Impact of device aging in the compact electro-thermal modeling of SiC power MOSFETs;Ceccarelli,2019

5. Development of advanced all-SiC power modules;Liang;IEEE Trans. Power Electron.,2014

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