Formation of coupled-cavities in quantum cascade lasers using focused ion beam milling-Reference-Cited by-同舟云学术

Formation of coupled-cavities in quantum cascade lasers using focused ion beam milling

Published:2015-08 Issue:9-10 Volume:55 Page:2142-2146
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Czerwinski Andrzej,Pluska Mariusz,Łaszcz Adam,Ratajczak Jacek,Pierściński Kamil,Pierścińska Dorota,Gutowski Piotr,Karbownik Piotr,Bugajski Maciej

Funder

NCBR

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Nanofabrication Using Focused Ion and Electron Beams. Principles and Applications,2012

2. Fabrication of electrochemical nanoelectrode for sensor application Using focused ion beam technology;Łaszcz;Pol. J. Chem. Technol,2014

3. FIB Damage in Silicon: Amorphization or Redeposition?;Rajsiri;Microsc. Microanal,2002

4. FIB-induced damage in silicon;Rubanov;J. Microsc,2004

5. Quantum Cascade Lasers. Intersubband Transitions in Quantum Wells: Physics and Device Applications;Faist,2000

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