High temperature corrosion resistance of electrically conductive nitrogen doped silicon carbide ceramics in molten fluorides
Author:
Funder
European Regional Development Fund
Vedecká Grantová Agentúra MŠVVaŠ SR a SAV
Publisher
Elsevier BV
Subject
Materials Chemistry,Ceramics and Composites
Reference59 articles.
1. Playing with carbon and silicon at the nanoscale;Melinon;Nat. Mater.,2007
2. Effect of moisture on corrosion of Ni-based alloys in molten alkali fluoride FLiNaK salt environments;Ouyang;J. Nucl. Mater.,2013
3. Stacking faults in silicon carbides;Iwata;Phys. B,2003
4. Interface characteristics affecting electrical properties of Y-doped SiC;Siegelin;J. Mater. Res,2003
5. Effect of AlN-content on the microstructure and fracture toughness of hot-pressed and heat-treated LPS-SiC ceramics;Strecker;J. Eur. Ceram. Soc.,2005
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