1. System using multiple reflections from curved surfaces;Arkad'ev;Soviet Technical Physics Letters,1988
2. Improved laboratory X-ray source for microfluorescence analysis;Arkad'ev;X-ray Spectrometry,1989
3. Theoretical capabilities of grazing-incidence X-ray optics;Arkad'ev;Soviet Technical Physics Letters,1988
4. Total reflection of γ rays from a surface;Arkad'ev;Soviet Technical Physics Letters,1986
5. Improved laboratory x-ray source for microfluorescence analysis;Carpenter;X-ray Spectrometry,1989