Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Force Microscopy;Burnham,1990
2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
3. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy
4. Progress in noncontact dynamic force microscopy
5. Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever
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