A cross-measurement procedure (CMP) for near noise-free imaging in scanning microscopes-Reference-Cited by-同舟云学术

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A cross-measurement procedure (CMP) for near noise-free imaging in scanning microscopes

Published:1999-02 Issue:1-2 Volume:76 Page:39-47
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Anguiano Eloy,Aguilar Miguel

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Digital Image Processing;Castleman,1979

2. Digital Picture Processing;Rosenfeld,1982

3. Image Processing, Analysis and Machine Vision;Sonka,1993

4. Computer Techniques for Image Processing in Electron Microscopy;Saxton,1978

5. A. Bonfiglio, B. Bianco, A. Cambiaso, L. Elementi, D. Ricci, Proc. XIV IEEE EMBS, vol. 4/1, IEEE Press New York, 1991, pp. 129.

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