Atomic force microscope characterization of a resonating nanocantilever-Reference-Cited by-同舟云学术

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Atomic force microscope characterization of a resonating nanocantilever

Published:2003-10 Issue:1-4 Volume:97 Page:127-133
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Abadal G.,Davis Z.J.,Borrisé X.,Hansen O.,Boisen A.,Barniol N.,Pérez-Murano F.,Serra F.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Micromechanics: A toolbox for femtoscale science: “Towards a laboratory on a tip”

2. Translating Biomolecular Recognition into Nanomechanics

3. A microcantilever-based alcohol vapor sensor-application and response model

4. Electromechanical model of a resonating nano-cantilever-based sensor for high-resolution and high-sensitivity mass detection

5. Fabrication and characterization of nanoresonating devices for mass detection

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2. Nonlinear Vibration Analysis of Curved Piezoelectric-Layered Nanotube Resonator;Energies;2021-12-01

3. Nonlinear detection mechanism in quantitative atomic force microscopy characterization of high-frequency nanoelectromechanical systems;Physical Review B;2012-01-20

4. Resonator Force Transducers;Handbook of Force Transducers;2011

5. DYNAMICS OF ELECTROSTATICALLY ACTUATED MICRO-ELECTRO-MECHANICAL SYSTEMS: SINGLE DEVICE AND ARRAYS OF DEVICES;International Journal of Bifurcation and Chaos;2009-03

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