1. Determination of the band gap of a thermal oxide on silicon;Adamchuk;Sov. Phys. Solid State,1984
2. Barrier energy determination at the semiconductor–insulator interface;Adamchuk;Sov. J. Phys. Chem. Mech. Surf.,1985
3. Internal photoemission spectroscopy of semiconductor–insulator interfaces;Adamchuk;Prog. Surf. Sci.,1992
4. Photocharging technique for barrier determination on semiconductor–insulator interface;Adamchuk;Phys. Status Solidi (a),1992
5. Electron scattering in the image force potential well during photoemission into insulator;Afanas’ev;Sov. J. Phys. Chem. Mech. Surf.,1991