Funder
Kansai University
Japan Society for the Promotion of Science
Reference32 articles.
1. A review of the pseudo-MOS transistor in SOI wafers: operation, parameter extraction, and applications;Cristoloveanu;IEEE Trans Electron Devices,2000
2. A review of electrical characterization techniques for ultrathin FDSOI materials and devices;Cristoloveanu;Solid State Electron,2016
3. A novel in-situ SOI characterization technique: the intrinsic point-probe MOSFET;Ionescu;IEEE Trans Electron Devices,2001
4. Adaptation of the pseudo-metal–oxide–semiconductor field effect transistor technique to ultrathin silicon–on-insulator wafers characterization: Improved set-up, measurement procedure, parameter extraction, and modeling;Van Den Daele;J Appl Phys,2013
5. Detailing influence of contact condition and island edge on dual-configuration Kelvin pseudo-MOSFET Method;Mori;IEEE Trans Electron Devices,2021