Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing-Reference-Cited by-同舟云学术

Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing

Published:1997-12 Issue:12 Volume:37 Page:1853-1858
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Pearn W.L.,Chen K.S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

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5. Application of Clements' method for calculating second and third generation process capability indices for non-normal Pearsonian populations;Pearn;Quality Engng,1994

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