Reinforcing built-in electric field via weakening metal–oxygen covalency within MOFs-based heterointerface for robust oxygen evolution reaction
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Published:2024-09
Issue:
Volume:495
Page:153464
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ISSN:1385-8947
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Container-title:Chemical Engineering Journal
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language:en
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Short-container-title:Chemical Engineering Journal
Author:
Hou Xianbiao,
Ni Tengjia,
Zhang Zhaozheng,
Zhou Jian,
Zhang Shucong,
Chu Lei,
Dai Shuixing,
Wang Huanlei,
Huang MinghuaORCID