Analyzing Burr-X competing risk model using adaptive progressive Type-II censored binomial removal data with application to electrodes and electronics-Reference-Cited by-同舟云学术

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Analyzing Burr-X competing risk model using adaptive progressive Type-II censored binomial removal data with application to electrodes and electronics

Published:2024-12 Issue:4 Volume:17 Page:101107
ISSN:1687-8507
Container-title:Journal of Radiation Research and Applied Sciences
language:en
Short-container-title:Journal of Radiation Research and Applied Sciences

Author:

Alqasem Ohud A.,Nassar Mazen,Abd Elwahab Maysaa Elmahi,Elshahhat Ahmed^ORCID

Funder

Princess Nourah bint Abdulrahman University Deanship of Scientific Research

Publisher

Elsevier BV

Reference48 articles.

1. Estimation under Burr type X distribution based on doubly type II censored sample of dual generalized order statistics;Abd El-Baset;Journal of the Egyptian Mathematical Society,2015

2. Modelling and analysis of software reliability with Burr type X testing-effort and release-time determination;Ahmad;Journal of Modelling in Management,2009

3. Inference of progressively type-II censored competing risks data from Chen distribution with an application;Ahmed;Journal of Applied Statistics,2020

4. Inference of progressively type-II censored competing risks data from Chen distribution with an application;Ahmed;Journal of Applied Statistics,2020

5. Inferences for stress–strength reliability of Burr Type X distributions based on ranked set sampling;Akgül;Communications in Statistics - Simulation and Computation,2022

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