Author:
Ninomiya Satoshi,Imanishi Nobutsugu,Xue Jianming,Gomi Shunichi,Imai M
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
11 articles.
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1. The Measurements of the Secondary Ion Emissions on the Charge State of Fast Ions and Clusters;Journal of the Physical Society of Japan;2008-03-15
2. Multiply charged Al recoils with impact of 2.0keV Si+ ions;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2007-07
3. Secondary ion emission from bio-molecular thin films under ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-03
4. Formation of multiply charged Al ions by direct recoil;Physical Review B;2006-04-19
5. Secondary neutral and ionized particle measurements under MeV-energy ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-04