Fault prediction of electronic devices based on attention mechanism time-series point process-Reference-Cited by-同舟云学术

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Fault prediction of electronic devices based on attention mechanism time-series point process

Published:2024-02 Issue: Volume:31 Page:101023
ISSN:2665-9174
Container-title:Measurement: Sensors
language:en
Short-container-title:Measurement: Sensors

Author:

Wu Borui,Zhao Wenrui

Publisher

Elsevier BV

Reference28 articles.

1. Thermal design and cooling performance evaluation of electronic equipment containing power electronic devices;Wang;Intern. J. Heat Technol.,2021

2. Remaining useful life prediction of lithium battery based on capacity regeneration point detection;Ma;Energy,2021

3. Analysis of electronic equipment recycling based on environmental economic background;Chen;IOP Conf. Ser. Earth Environ. Sci.,2021

4. Lifetime evaluation method for electronic equipment of wayside signalling systems;Kunisaki;Quarterly reports of RTRI,2021

5. Research of diagnostic models of radioelectronic equipment;Sakovych;Elektronnoe Model.,2021

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