Experimental research of stability of thin films on the basis of depleted uranium as reflecting coating for wavelength of 4.5nm-Reference-Cited by-同舟云学术

Experimental research of stability of thin films on the basis of depleted uranium as reflecting coating for wavelength of 4.5nm

Published:2007-05 Issue:1-2 Volume:575 Page:248-250
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Artioukov I.A.,Chefonov O.V.,Gilev O.N.,Lipin A.V.,Ostashev V.I.,Potapov A.V.,Pronin V.A.,Svyatov I.L.,Vikhlyaev D.A.,Vinogradov A.V.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference4 articles.

1. Soft X-ray multilayer mirrors based on depleted uranium

2. D. Oliphant, Characterization of uranium, uranium oxide and silicon multilayer films, Masters Thesis, BYU, Provo, UT, 2000. p. 63.

3. A.L. Zapysov, I.M. Izrailev, V.P. Nikitin, et al., Graduation of detectors of low-energy X-ray radiation, in: Diagnostics of plasma, M., Energoatomizdat, 1989, p. 47. (in Russian).

4. I.A. Artioukov, R.M. Fechtchenko, A.V. Vinogradov, S.I. Sagitov, D.A. Vikhlyaev, A.V. Lipin, V.I. Ostashev, A.V. Pronin, Study of sputtered depleted uranium as a reflective coating for the soft X-rays, International Conference on X-ray Optics and Microanalysis ICXOM-XVIII, Frascati, Roma, September 25–30, 2005, Book of Program & Abstracts, p. 64.

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