Toward deeper ultraviolet detection: Atomic layer deposited amorphous AlGaOx thin film detector with its tunable optical properties and opto-electronic responses-Reference-Cited by-同舟云学术

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Toward deeper ultraviolet detection: Atomic layer deposited amorphous AlGaOx thin film detector with its tunable optical properties and opto-electronic responses

Published:2024-06 Issue:11 Volume:50 Page:19856-19863
ISSN:0272-8842
Container-title:Ceramics International
language:en
Short-container-title:Ceramics International

Author:

Liu Weiming,Zhu Xudan^ORCID,Ding Yifan,Tang Hongyu,Xu Peiran,Huang Tiantian,Zheng Yuxiang,Chen Xin,Zhang Rongjun^ORCID

Publisher

Elsevier BV

Reference64 articles.

1. A review of Ga2O3 materials, processing, and devices;Pearton;Appl. Phys. Rev.,2018

2. Fabrication of UV-C photodetector with ultimate stability in extreme space environments (radiation, low temperature) using aerosol-deposited Ga2O3;Cho;Ceram. Int.,2023

3. Wide bandgap oxide semiconductors: from materials physics to optoelectronic devices;Shi;Adv. Mater.,2021

4. Review of gallium-oxide-based solar-blind ultraviolet photodetectors;Chen;Photon. Res.,2019

5. Evolution of optical properties and electronic structures: band gaps and critical points in MgxZn1−xO (0 ≤ x ≤ 0.2) thin films;Shi;Phys. Chem. Chem. Phys.,2018

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