Uncertain process-based data integration and residual lifetime evaluation of PCB in airborne equipment with ADT and field data-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Uncertain process-based data integration and residual lifetime evaluation of PCB in airborne equipment with ADT and field data

Published:2024-08 Issue:8 Volume:37 Page:233-245
ISSN:1000-9361
Container-title:Chinese Journal of Aeronautics
language:en
Short-container-title:Chinese Journal of Aeronautics

Author:

WANG Yu^ORCID,KANG Rui,GUO Linhan^ORCID,LI Xiaoyang^ORCID,LIU Zhe,WANG Xiaohui,ZHANG Weifang

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Reference38 articles.

1. Lifetime prediction of electrochemical ion migration with various surface finishes of printed circuit boards;Hong;J Electron Mater,2020

2. Electrochemical migration of Sn and Sn solder alloys: a review;Zhong;RSC Adv,2017

3. Overview of reliability testing;Elsayed;IEEE Trans Reliab,2012

4. Life model of the electrochemical migration failure of printed circuit boards under NaCl solution;Zhou;IEEE Trans Device Mater Reliab,2019

5. Data-driven life modeling of electrochemical migration on printed circuit boards under soluble salt contamination;Zhou;IEEE Access,2020

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP