On the characterization of basal plane stacking faults in N9R and N18R martensites
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference25 articles.
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2. Analysis of one-dimensional disordered structures by simulation technique;Philosophical Magazine;2007-06-21
3. Measurement of Lattice Displacements at Planar Defects in 2H and 18R Martensites;Microscopy and Microanalysis;2004-03-17
4. Investigation of One-Dimensionally Disordered Structures of AIIBVI Crystals by Monte Carlo Technique. II. 2H Structure with Different Kinds of Stacking Faults;Crystal Research and Technology;2001-02
5. Imperfect dislocations at non-basal plane defects in 18R and 2H martensites: Transmission electron microscopy studies;Philosophical Magazine A;1999-03
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