Author:
Kaesdorf S.,Hartmann M.,Schröder H.,Kompa K.L.
Cited by
34 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Saturating multiple ionization in intense mid-infrared laser fields;New Journal of Physics;2021-05-01
2. Secondary ion formation during electronic and nuclear sputtering of germanium;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-06
3. SURFACE ANALYSIS | Secondary Neutral Mass Spectrometry;Reference Module in Chemistry, Molecular Sciences and Chemical Engineering;2013
4. Secondary neutral and ionized particle measurements under MeV-energy ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-04
5. SURFACE ANALYSIS | Secondary Neutral Mass Spectrometry;Encyclopedia of Analytical Science;2005