Measurement of Surface Shape by Scanning Electron Microscope Using Detection of Normal-Reference-Cited by-同舟云学术

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Measurement of Surface Shape by Scanning Electron Microscope Using Detection of Normal

Published:1986 Issue:1 Volume:35 Page:365-368
ISSN:0007-8506
Container-title:CIRP Annals
language:en
Short-container-title:CIRP Annals

Author:

Sato H.,O-Hori M.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference6 articles.

1. Surface Roughness Measurement by Scanning Electron Microscope;Sato;Annals CIRP,1982

2. Surface Roughness Measurement by Scanning Electron Microscope Due to Digital Method;Sato;Trans. JSME, C,1985

3. Fine Surface Roughness Measurement by SEM Signal;Soejima;Preprint of Japan Soc, SEM,1977

4. Stereoscopic Observation and Three Dimensional Measurement of SEM;Kato;Proc. SEM Symp.,1977

5. Microscopic Measurement of Fatigue Damage by Scanning Electron Microscope;Kikukawa;Jour. SMSJ,1974

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years;CIRP Annals;2001

2. Tribology in Metal Rolling Keynote Presentation Forming Group F;CIRP Annals;2000

3. Twin-Probe Vibroscanning Method for Dimensional Measurement of Microholes;CIRP Annals;1997

4. Use of atomic force microscopy for surface roughness determination of ball bearings;Surface and Coatings Technology;1993-12

5. Vibroscanning Method for Nondestructive Measurement of Small Holes;CIRP Annals - Manufacturing Technology;1993-01

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