Author:
Cichorek T,Henkie Z,Drulis H,Klamut J
Subject
Electrical and Electronic Engineering,Energy Engineering and Power Technology,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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1. Ion beam analysis of composition and impurities in YBa2Cu3O7−δ and Bi2Sr2Ca2Cu3O10−δ superconductor thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-03