Non-destructive determination of the coating film thickness by X-ray powder diffractometry and correlation with the dissolution behavior of film-coated tablets-Reference-Cited by-同舟云学术

Non-destructive determination of the coating film thickness by X-ray powder diffractometry and correlation with the dissolution behavior of film-coated tablets

Published:2010-03 Issue:4 Volume:51 Page:952-957
ISSN:0731-7085
Container-title:Journal of Pharmaceutical and Biomedical Analysis
language:en
Short-container-title:Journal of Pharmaceutical and Biomedical Analysis

Author:

Yamada Hiroyuki,Terada Katsuhide,Suryanarayanan Raj

Publisher

Elsevier BV

Reference28 articles.

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2. Quantitative determination of polymorphic composition in intact compacts by parallel-beam X-ray powder diffractometry;Cao;J. Pharm. Biomed. Anal.,2002

3. Quantitative analysis of crystalline pharmaceuticals in powders and tablets by a pattern-fitting procedure using X-ray powder diffraction data;Yamamura;Int. J. Pharm.,2001

4. Quantitative analysis of the active tablet ingredient by powder X-ray diffractometry;Suryanarayanan;Pharm. Res.,1991

5. Introduction to two-dimensional X-ray diffraction;He;Powder Diffr.,2003

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