The analysis of microhardness measurement approach for characterization of hard coatings-Reference-Cited by-同舟云学术

The analysis of microhardness measurement approach for characterization of hard coatings

Published:2003-10 Issue:10-11 Volume:12 Page:1788-1792
ISSN:0925-9635
Container-title:Diamond and Related Materials
language:en
Short-container-title:Diamond and Related Materials

Author:

Trakhtenberg I.Sh.,Vladimirov A.B.,Rubstein A.P.,Kuzmina E.V.,Uemura K.,Gontar A.G.,Dub S.N.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Materials Chemistry,Mechanical Engineering,General Chemistry,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Yu.N. Tolmachev, V.L. Bukhovets, I.G. Varshavskaya, N. Ravi, in Proceedings of ISDF4, Kharkov, Ukraina, 1999, p. 207

2. Engineering properties of fully sp3- to sp2-bonded carbon films and their modifications after post-growth ion irradiation

3. S.N. Dub, in Proceedings of ISDF4, Kharkov, Ukraina,1999, p. 219

4. I.Sh. Trakhtenberg, S.A. Plotnikov, A.E. Davletshin, I.N. Korneev, A.P. Rubstein, A.B. Vladimirov, O.M. Bakunin, in Proceedings of ADC/FCT-99, p. 623

5. Ultrahard and superhard phases of fullerite C60: Comparison with diamond on hardness and wear

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