Combined X-ray microdiffraction and micromechanical testing for direct measurement of thin film elastic constants-Reference-Cited by-同舟云学术

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Combined X-ray microdiffraction and micromechanical testing for direct measurement of thin film elastic constants

Published:2025-04 Issue: Volume:252 Page:113720
ISSN:0264-1275
Container-title:Materials & Design
language:en
Short-container-title:Materials & Design

Author:

Janknecht Rebecca,Hahn Rainer,Koutná Nikola,Todt Juraj,Meindlhumer Michael,Davydok Anton,Riedl Helmut,Keckes Jozef,Mayrhofer Paul H.

Funder

Bundesministerium für Digitalisierung und Wirtschaftsstandort

Swedish Research Council

Austrian Research Promotion Agency

National Foundation for Science and Technology Development

Technische Universität Wien Bibliothek

Christian Doppler Forschungsgesellschaft

Publisher

Elsevier BV

Reference85 articles.

1. Materials science-based guidelines to develop robust hard thin film materials;Mayrhofer;Prog. Mater. Sci.,2024

2. Concepts for the design of advanced nanoscale PVD multilayer protective thin films;Stueber;J. Alloys. Compd.,2009

3. A review of the intrinsic ductility and toughness of hard transition-metal nitride alloy thin films;Kindlund;Thin Solid Films,2019

4. Recent progress on wear-resistant materials: designs, properties, and applications;Zhai;Adv. Sci.,2021

5. A novel development of sustainable cutting inserts based on PVD-coated natural rocks;Breidenstein;Mater. Today Sustainability,2023

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