1. Kang W, Gluchenkov O, Boyong H, Li Y, Malik R, Clevenger L, et al. In: Technical Digest—International Electron Devices Meeting, Washington, DC, USA, December 3–5, 2001. p. 59.
2. Takenaka N, Segawa M, Uehara T, Akamatsu S, Matsumoto M, Kurimoto K, et al. In: 2000 Symposium on VLSI Technology Digest of Technical Papers, Honolulu, USA, June 13–15; 2000. p. 62.
3. Jung J, Lee S, Sung Y, Lee B, Choi J, Lee B, et al. In: Technical Digest—International Electron Devices meeting, San Francisco, USA, December 10–13; 2000. p. 36.
4. Kim I, Kim N, Choy J, Lee B, Sung Y, Kim J, et al. In: Technical Digest—International Electron Devices meeting, Washington, DC, USA, December 3–5, 2001. p. 615.