Effect of extended defects on phonon confinement in polycrystalline Si and Ge films
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Published:2024-10
Issue:
Volume:181
Page:108659
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ISSN:1369-8001
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Container-title:Materials Science in Semiconductor Processing
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language:en
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Short-container-title:Materials Science in Semiconductor Processing
Author:
Arapkina Larisa V.ORCID,
Chizh Kirill V.,
Uvarov Oleg V.,
Voronov Valery V.,
Dubkov Vladimir P.,
Storozhevykh Mikhail S.,
Poliakov Maksim V.,
Volkova Lidiya S.,
Edelbekova Polina A.,
Klimenko Alexey A.,
Dudin Alexander A.,
Yuryev Vladimir A.