Numerical simulation of electric field enhancement on the exit surface of fused silica induced by particle contamination
Author:
Funder
Key Technologies Research and Development Program
Nanjing Forestry University
Publisher
Elsevier BV
Reference52 articles.
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2. Fate of nanosecond-pulsed 351 nm laser-ejected glass contaminants on fused silica under subsequent laser exposure;Raman,2018
3. Mechanisms governing the interaction of metallic particles with nanosecond laser pulses;Demos;Opt Express,2016
4. A quantitative analysis of single pulse ultraviolet dry laser cleaning;Halfpenny;J. Appl. Phys.,1999
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