Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference23 articles.
1. A. von Bohlen, M. Krämer, C. Sternemann, M. Paulus. The influence of X-ray coherence length on TXRF and XSW and the characterization of nanoparticles observed under grazing incidence of X-rays. J. Anal. At. Spectrom. 24 (2009) 792–800.
2. Determination of critical thickness and the sensitivity for thin film analysis by total reflection X-ray fluorescence spectrometry;Klockenkämper;Spectrochim. Acta Part B,1989
3. Saturation effects in TXRF on micro-droplet residue samples;Hellin;J. Anal. At. Spectrom.,2004
4. Chemical analysis of used three way catalysts by total reflection X-ray fluorescence;Fernández-Ruiz;Anal. Chem.,2002
5. TXRF analysis of aged three way catalysts;Fernández-Ruiz;Analyst,2006
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