Depth profile analyses with sub 100-nm depth resolution of a metal thin film by femtosecond - laser ablation - inductively coupled plasma - time-of-flight mass spectrometry-Reference-Cited by-同舟云学术

Depth profile analyses with sub 100-nm depth resolution of a metal thin film by femtosecond - laser ablation - inductively coupled plasma - time-of-flight mass spectrometry

Published:2018-11 Issue: Volume:149 Page:176-183
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Käser Debora,Hendriks Lyndsey,Koch Joachim,Günther Detlef

Funder

ETH Zürich

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference43 articles.

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5. Structural studies of n-type nc-Si–QD thin films for nc-Si solar cells;Das;J. Phys. Chem. Solids,2017

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