Determination of relative sensitivity factors for trace element analysis of solar cell silicon by fast-flow glow discharge mass spectrometry-Reference-Cited by-同舟云学术

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Determination of relative sensitivity factors for trace element analysis of solar cell silicon by fast-flow glow discharge mass spectrometry

Published:2011-02 Issue:2 Volume:66 Page:144-148
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Di Sabatino Marisa,Dons Anne L.,Hinrichs Joachim,Arnberg Lars

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference13 articles.

1. Impurities in silicon solar cells;Davis;IEEE Trans. Electron Devices,1980

2. Specification of solar grade silicon: how common impurities affect the cell efficiency of mc-Si solar cells;Geerligs,2005

3. Control of metal impurities in “dirty” multicrystalline silicon for solar cells;Istratov;Mater. Sci. Eng. B,2006

4. Glow discharge mass spectrometry;Hoffmann;Anal. Bioanal. Chem.,2005

5. Glow discharge plasmas in analytical spectroscopy;Marcus,2003

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