Differential characteristics of the particles sputtered by gas cluster ions at elevated temperatures. Molecular dynamics simulation
Author:
Funder
Moscow State University of Geodesy and Cartography
Lomonosov Moscow State University
Russian Science Foundation
Publisher
Elsevier BV
Reference44 articles.
1. GaBiLi - a novel focused ion beam (FIB) source for ion microscopy and related workflows for 3D tomography with a top-down FIB from liquid metal alloy ion sources (lmais);Richter;Microsc. Microanal.,2023
2. Ion beam tools for nondestructive in-situ and in-operando composition analysis and modification of materials at the Tandem Laboratory in Uppsala;Ström;J. Instrum.,2022
3. Thin film depth profiling by ion beam analysis;Jeynes;Analyst,2016
4. Reverse epitaxy of Ge: ordered and faceted surface patterns;Ou;Phys. Rev. Lett.,2013
5. A perspective on nanoscale pattern formation at surfaces by ion-beam irradiation;Cuerno;J. Appl. Phys.,2020
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